TH2818XA/TH2818XB Automatic Transformer Test System
TH2818XA/XB is an Automatic Transformer multi-parameter Test instrument used for quality control of electronic transformer over a wide range of frequency (20Hz to300 kHz). Almost all low voltage transformer parameters can be scanned. The primary parameters include Inductance L, Leakage Inductance Lk, Turns-Ratio Tr, DC resistance DCR, Impedance |Z|, and Capacitance (between windings) C etc.; The secondary parameters include Quality Factor Q , ESR and Phase etc., Pin short can also be detected. The advanced digital sampling technique and high speed scanning test fixture make the transformer inspection more accurate and efficient, it was used to be low-efficient before the use of such a test system. TH2818XA/XB provides several signal output impedances for selection in order to be compatible with some well-known LCR instrument providers when an inductor is measured. Turns-ratio is calculated by the inductance of primary and secondary windings, which decreases the measurement error caused by large leakage of magnetic flux for example low coupling coefficient transformer. TH2818XA is also a precision impedance test instrument with 6 digit display resolution over a wide measurement range. It can be used for incoming inspection of components, quality control of product line and laboratory use.
Features:| ◆320×240
dot-matrix large graphics LCD display; ◆Chinese and English language user interface selectable; ◆LCRZ, DCR, Turn-Ratio etc. test functions; ◆20Hz to 300kHz test frequencies, 10mHz resolution; ◆2 different signal source output impedances: 30Ω and 100Ω; ◆0.05% basic test accuracy; ◆Open, Short and Load correction functions; ◆10 points List sweep function (TH2818XA only); ◆Built-in comparator, 10 bins and bin counters(TH2818XA only); ◆Test signal level monitor function (TH2818XA only); ◆Automatic level control function for V and I(TH2818XA only); ◆0 V, 1.5 V and 2 V internal DC bias voltage; ◆Up to 20 control setting files memory for LCRZ measurement; ◆Up to 40 control setting files memory for transformer measurement; ◆Standard RS-232C interface; ◆Optional HANDLER and GPIB interface; ◆Optional ±10 V (±100 mA) and 1 A internal DC bias source; ◆Optional USB interface and 32 MB USB-Disk. |
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TH1801A
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TH1801B
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![]() TH2818XA |
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![]() TH2818XB |
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| TH2818XA | Transformer scan test plus LCR meter |
| TH2818XB | Transformer scan test |
| TH2818XA LCR Test Parameters | |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR, Turn-Ratio, Phase, Lk |
| Transformer Test Parameter | Turn Ratio, Turns, Phase, L, C, Lk, Q, ACR, DCR, Balance, Pin Short |
| Test Frequency | 20Hz~300kHz,Resolution: 10 mHz, Accuracy: 0.01% |
| Test Level | Turn-Ratio: 5 mV to 4 V,ALC: 10 mV to 1 V, Resolution: 1 mV, Accuracy: 5% Normal:5 mV to 2 V |
| Output Impedance | 30 Ω、100 Ω Seletable |
| Basic Accuracy | LCRZ,DCR: 0.05% ; Turns-Ratio: 0.5% |
| Turns-Ratio Display Range | 1:0.01~100:1 |
| DCR Display Range | 1mΩ~99.9999MΩ |
| Display Range | |Z|、R、X:0.00001Ω~99.9999MΩ |Y|、G、B:0.00001μs~99.9999s C:0.00001pF~9.99999F L:0.00001μH~99.9999kH D:0.00001~9.99999 Q:0.00001~99999.9 θ(DEG):-179.999°~179.999° θ(RAD):-3.14159~3.14159 Turn-Ratio:1:0.01~100:1 Δ%:-999.999%~999.999% |
| Measuring Time(≥1kHz) | Fast: 32 ms, Med: 90 ms, Slow: 650 ms |
| Equivalents Circuit | Series and Parallel |
| Ranging Mode | Auto and Hold |
| Trigger Mode | Internal, Manual and External |
| Averaging Rate | 1~255 |
| Correction Function | Open, Short and Load |
| Internal DC bias source | 0V、1.5V、2V,Accuracy:1% |
| TH2818XA Comparator function | 10 bins and bin counters |
| Memory | 20 control setting files memory for LCRZ test 40 control setting files memory for transformer test |
| Operation Temperature And Humidity | 0℃~40℃,less than 90% RH |
| Power Requirements | 198~242V AC,47.5~52.5Hz |
| Power Consumption | ≤80VA |
| Dimensions(W×H×D) | TH2818XA/TH2818XB:430mm×185mm×473mm,TH1801A/TH1801B:270mm×186mm×73mm |
| Weight | TH2818XA/TH2818XB:13 kg Approx,TH1801A/TH1801B:4 kg Approx |